Testing

Embedded System

This set of Embedded Systems Multiple Choice Questions & Answers (MCQs) focuses on “Testing”.

1. Which of the following is a set of specially selected input patterns?
a) test pattern
b) debugger pattern
c) bit pattern
d) byte pattern

2. Which is applied to a manufactured system?
a) bit pattern
b) parity pattern
c) test pattern
d) byte pattern

3. Which of the following is based on fault models?
a) alpha-numeric pattern
b) test pattern
c) bit pattern
d) parity pattern

4. Which is also called stuck-at model?
a) byte pattern
b) parity pattern
c) bit pattern
d) test pattern

5. How is the quality of the test pattern evaluated?
a) fault coverage
b) test pattern
c) size of the test pattern
d) number of errors

6. What is DfT?
a) discrete Fourier transform
b) discrete for transaction
c) design for testability
d) design Fourier transform

7. Which of the following is also known as boundary scan?
a) test pattern
b) JTAG
c) FSM
d) CRC

8. What does BILBO stand for?
a) built-in logic block observer
b) bounded input bounded output
c) built-in loading block observer
d) built-in local block observer

9. What is CRC?
a) code reducing check
b) counter reducing check
c) counting redundancy check
d) cyclic redundancy check

10. What is FSM?
a) Fourier state machine
b) finite state machine
c) fast state machine
d) free state machine

11. Which of the following have flip-flops which are connected to form shift registers?
a) scan design
b) test pattern
c) bit pattern
d) CRC

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